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PostDocs : selection by topics

Technological challenges >> Advanced nano characterization
2 proposition(s).

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Advanced tandem time of flight mass spectrometry for micro and nanotechnologies

Département des Plateformes Technologiques (LETI)

Laboratoire Analyses de Surfaces et Interfaces

01-12-2020

PsD-DRT-21-0011

jean-paul.barnes@cea.fr

Nano-caractérisation avancée (.pdf)

The CEA LETI seeks to recruit a post-doctoral researcher to work on the development of advanced time of flight secondary ion mass spectrometry applications (TOF-SIMS). The candidate will work on a new TOF-SIMS instrument equipped with tandem MS spectrometry, in-situ FIB and Argon cluster sputtering. The research project will be focused around the following topics - Developing methods to correlate TOF-SIMS with AFM, XPS and Auger - Improving the sensitivity and efficiency of fragmention of the tandem MS spectrometer - Developing 3D FIB-TOF-SIMS applications and improving the spatial resolution. The candidate will also have access to the wide range of state of the art instruments present on the nanocharacterisation platform as well as bespoke samples coming from the advanced technology branches developed at the LETI. The candidate will also benefit from a collaboration with the instrument supplier.

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Operando photoelectron spectroscopy by HAXPES studies to elucidate the switching mechanisms in manganite valence-change memory (VCM) devices

Département des Plateformes Technologiques (LETI)

Laboratoire Analyses de Surfaces et Interfaces

01-02-2021

PsD-DRT-21-0018

orenault@cea.fr

Nano-caractérisation avancée (.pdf)

Manganite heterostructures show very promising resistive switching (RS) characteristics and multilevel resistance states. The benefits of operando HArd X-ray PhotoElectron Spectropscopy (HAXPES) for understanding the RS in VCM structures were demonstrated using synchrotron-radiation HAXPES [1]. HAXPES in operando mode (i.e biaising the VCM in situ during the photoemission), will be implemented to characterize the critical LSMO/electrode interface and unravel the switching mechanisms, correlating with the electrical characterizations performed at LMGP. The candidate will work mainly at the Platform For NanoCharacterization of CEA-Leti (PFNC, Minatec Campus), and within the very stimulating collaboration between two leading laboratories in their respective field: CNRS-LMGP (VCM devices) and CEA-Leti (characterization by advanced photoemission. [1] B. Meunier, E. Martinez, M. Burriel, O. Renault et al., J. Appl. Phys. 126, 225302 (2019).

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